This is a list of publications from the group in reverse chronological order

Journal Papers

Phase composition and electrical characteristics of Nickel Silicide Schottky contacts formed on 4H-SiCSemiconductor Science and Technology, 2009

Radiation induced change in defect density in HfO2 based MIM capacitorsIEEE Transactions on Nuclear Science, 2009

Prospects for SiC electronics and sensors‘ Materials Today, 2008
Role of Oxygen in high temperature Hydrogen Sulphide detectionMeasurement Science and Technology, 2008

The role of carbon contamination in voltage linearity and leakage current in high-k metal-insulator-metal capacitors‘, Journal of Applied Physics, 2008

Energy-band alignment of HfO2/SiO2/SiC gate dielectric stackApplied Physics Letters, 2008

Trap assisted gas sensing mechanism in Pd/TiO2/SiO2/SiC capacitors at high temperatures‘ IEEE Sensors Journal, 2007

Direct measurement of electromigration induced stress in interconnect structures‘ IEEE Transactions on Device and Materials Reliability, 2007
Leakage current and charge trapping behaviour in TiO2/SiO2 high-k gate dielectric stack on 4H-SiC substrate‘ Journal of Vacuum Science B, 2007

Effects of interface engineering for HfO2 gate dielectric stack on 4H-SiC‘ Journal of Applied Physics, 2007

Semi-transparent SiC Schottky diodes for X-ray spectroscopy‘ Nuclear Instrumentation and Methods A, 2007

SiC Sensors, a reviewJournal of Physics D, 2007

Conference Papers


One response

14 09 2010
Extreme Technology III « Resilient Technology Blog

[…] Publications […]

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